UPGRADE SISTEM DETEKTOR PCD KE SDD PADA ALAT XRF QUANT’X IRM - Helmi Fauzi R Helmi R.; Agus Jamaludin Agus Jamaludin (PIN Pengelolaan Instalasi Nuklir, 2017)
ABSTRAKKemajuan teknologi pendeteksi hasil sinar  X - Ray fluoresence semakin berkembang, adanya teknologi elektronik semikonduktor membuat sistem pendeteksian semakin ramping dan simpel. Penggantian bagian detektor alat XRF Arl – quant’X bertujuan untuk memperbaiki sekaligus meningkatkan kemampuan alat tersebut di instalasi radiometalurgi- PTBBN. Peningkatan performa X –ray fluorescence dengan meng – upgrade dari PCD (Peltier Cooled Detector) ke SDD (Silicon Drift Detector) berhasil dibuktikan dengan data kalibrasi gain DAC yang sesuai pengaturan (setting), Uji kestabilan operasi di perulangan 50 kali proses yang memenuhi kategori stabil  (On Spec), nilai resolusi terbaik yang ditunjukkan oleh nilai Full Width at Half Maximum (FWHM) sebesar 158 KeV, dan hasil pengujian kualitatif dengan ketepatan identifikasi spektrum di setiap unsurnya (Zr, Sn, Cr & Ni) serta hasil pengujian kuantitatif komposisi unsur standard zirconium (Zr = 98 %, Sn = 1,4 % , Cr = 0,1% , Ni = 0,05 %) telah sesuai dengan sertifikat CRM JAEA yang menjadi acuannya. Kata Kunci : Upgrade, X-ray Fluoresence, PCD detector, SDD detector  ABSTRACTThe progress of x-ray detection technology with fluorescence is growing up, the presence  of semiconductor electronic technology makes detection system more slim and simple. The replacement of XRF Arl-quant'X detector section aimed at fixing and improving the equipment at the radiometallurgi installation – PTBBN. Improved performance of X -ray fluorescence by upgrading from PCD (Peltier Cooled Detector) to SDD (Silicon Drift Detector) has been proven with calibration data of adjustable DAC gain setting, he stability test operation in 50 repetitions of the process that meets the stable category (On Spec), the best resolution value shown by the value of Full Width at Half Maximum (FWHM) of 158 KeV, and the results of qualitative testing with the accuracy of spectrum identification in each element (Zr, Sn, Cr & Ni) and the result of quantitative testing of standard zirconium element composition (Zr = 98%, Sn = 1,4%, Cr = 0,1%, Ni = 0,05%) are in accordance with JAEA CRM certificate which become its reference . Keywords  : Upgrade,  X-ray Fluoresence,  PCD detector,  SDD detector.