Article Per Year (5 Year)
p-Index From 2020 - 2025
0.23
P-Index
This Author published in this journals
All Journal International Journal of Power Electronics and Drive Systems (IJPEDS) International Journal of Advances in Applied Sciences
Nalin Kant Mohanty
Sri Venkateswara College of Engineering
Control & Systems Engineering Earth & Planetary Sciences Electrical & Electronics Engineering Environmental Science Materials Science & Nanotechnology Mathematics Physics

Published : 2 Documents Claim Missing Document
Claim Missing Document
Check
Articles

Found 1 Documents
Search
Journal : International Journal of Advances in Applied Sciences

 1 
High impedance fault detection in distribution system Kavaskar Sekar; Nalin Kant Mohanty
International Journal of Advances in Applied Sciences Vol 8, No 2: June 2019
Publisher : Institute of Advanced Engineering and Science

Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (1490.112 KB) | DOI: 10.11591/ijaas.v8.i2.pp95-102

Abstract

High impedance faults (HIFs) present a huge complexity of identification in an electric power distribution network (EPDN) due to their characteristics. Further, the growth of non-linear load adds complexity in HIF detection. One primary challenge of power system engineers is to reliably detect and discriminate HIFs from normal distribution system load and other switching transient disturbances. In this study, a novel HIF detection method is proposed based on the simulation of an accurate model of an actual EPDN study with real data. The proposed method uses current signal alone and does not require voltage signal. Wavelet transform (WT) is used for signal decomposition to extract statistical features and classification of HIF into Non-HIF (NHIF) by Neural Networks (NNs). The simulation study of the proposed method provides good, consistent and powerful protection for HIF.
Co-Authors Ashwin Kumar Sahoo Dhanaraj Amudhavalli Kavaskar Sekar