International Journal of Electrical and Computer Engineering
Vol 7, No 1: February 2017

Recognition of Tomato Late Blight by using DWT and Component Analysis

Hiteshwari Sabrol (Panjab University, Chandigarh, India)
Satish Kumar (Panjab University Chandigarh, India)



Article Info

Publish Date
01 Feb 2017

Abstract

Plant disease recognition concept is one of the successful and important applications of image processing and able to provide accurate and useful information to timely prediction and control of plant diseases. In the study, the wavelet based features computed from RGB images of late blight infected images and healthy images. The extracted features submitted to Principal Component Analysis (PCA), Kernel Principal Component Analysis (KPCA) and Independent Component Analysis performed (ICA) for reducing dimensions in feature data processing and classification. To recognize and classify late blight from healthy plant images are classified into two classes i.e.  late blight infected or healthy. The Euclidean Distance measure is used to compute the distance by these two classes of training and testing dataset for tomato late blight recognition and classification. Finally, the three-component analysis is compared for late blight recognition accuracy. The Kernel Principal Component Analysis (KPCA) yielded overall recognition accuracy with 96.4%.

Copyrights © 2017






Journal Info

Abbrev

IJECE

Publisher

Subject

Computer Science & IT Electrical & Electronics Engineering

Description

International Journal of Electrical and Computer Engineering (IJECE, ISSN: 2088-8708, a SCOPUS indexed Journal, SNIP: 1.001; SJR: 0.296; CiteScore: 0.99; SJR & CiteScore Q2 on both of the Electrical & Electronics Engineering, and Computer Science) is the official publication of the Institute of ...