Jurnal Ilmiah Teknik Elektro Komputer dan Informatika (JITEKI)
Vol 5, No 2 (2019): December

Mobile Forensics for Cyberbullying Detection using Term Frequency - Inverse Document Frequency (TF-IDF)

Imam Riadi (Universitas Ahmad Dahlan)
Sunardi Sunardi (Universitas Ahmad Dahlan)
Panggah Widiandana (Universitas Ahmad Dahlan)



Article Info

Publish Date
30 Dec 2019

Abstract

The case of cyberbullying in Indonesia was ranked third in the world in 2015 and as much as 91% was experienced by children [1]. RSA Anti Fraud Command Center (AFCC) report reports that in 2015 45% of transactions were carried out through mobile channels, while 61% of fraud occurred through mobile devices [2]. WhatsApp in July 2019, 1.6 billion users access the WhatsApp messenger on a monthly basis [10]. The data opens a reference for investigators to better anticipate cybercrime actions that can occur in the whatsapp application because more users are using the application. In this study using the TF-IDF method in detecting cyberbullying that occurs in order to be able to add a reference for investigators. The conclusions that have been obtained from the simulation of conversations between four people in a whatsapp group get the results of the cyberbullying rate that the user "a" has a cyberbullying rate of 66.80%, the user "b" has a cyberbullying rate of 50%, the user "c" has a level cyberbullying is 33.19%, user "c" has a cyberbullying rate of 0% from the data proving that the TF-IDF method can help investigators detect someone who will commit cyberbullying actions but in its development a better way is needed when preprocessing so that the abbreviation or changing words can still be detected perfectly.

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Journal Info

Abbrev

JITEKI

Publisher

Subject

Computer Science & IT Electrical & Electronics Engineering

Description

JITEKI (Jurnal Ilmiah Teknik Elektro Komputer dan Informatika) is a peer-reviewed, scientific journal published by Universitas Ahmad Dahlan (UAD) in collaboration with Institute of Advanced Engineering and Science (IAES). The aim of this journal scope is 1) Control and Automation, 2) Electrical ...