Indonesian Journal of Electrical Engineering and Computer Science
Vol 12, No 10: October 2014

Effects of Non-Uniform Channel Geometry on Double-Gate MOSFET Performance

Xu Huifang (An Hui University)
Dai Yuehua (Anhui University)
Zheng Changyong (Anhui University)
Xu Jianbin (Anhui University)
Yang Jin (Anhui University)
Dai Guangzhen (Anhui University)



Article Info

Publish Date
01 Oct 2014

Abstract

A Double-gate (DG) MOSFET with non-uniform channel (NUC) geometry, that is, the silicon thickness of embedded in double-gate is varied linearly from drain to source, is proposed. To quantitatively assess the effects of the NUC geometry on electrical characteristics of DG MOSFETs, the short-channel effects (SCEs) and the on-state current are numerically calculated for the device with different non-uniform channel thickness, channel length and gate oxide thickness respectively. To the proposed structure, the SCEs are suppressed, the subthreshold swing becomes smaller and the on-state current is significantly improved when the thickness of silicon lied at source becomes thinner, showing better performances than the conventional DG MOSFETs.

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