Journal La Multiapp
Vol. 1 No. 2 (2020): Journal La Multiapp

Analysis on Band Layer Design and J-V characteristics of Zinc Oxide Based Junction Field Effect Transistor

Ms Chaw Su Nandar Hlaing (Department of Electronic Engineering, Mandalay, Myanmar)
Thiri Nwe (Department of Electronic Engineering, Technological University (Mandalay), Mandalay, Myanmar)



Article Info

Publish Date
21 Jun 2020

Abstract

This paper presents the band gap design and J-V characteristic curve of Zinc Oxide (ZnO) based on Junction Field Effect Transistor (JFET). The physical properties for analysis of semiconductor field effect transistor play a vital role in semiconductor measurements to obtain the high-performance devices. The main objective of this research is to design and analyse the band diagram design of semiconductor materials which are used for high performance junction field effect transistor. In this paper, the fundamental theory of semiconductors, the electrical properties analysis and bandgap design of materials for junction field effect transistor are described. Firstly, the energy bandgaps are performed based on the existing mathematical equations and the required parameters depending on the specified semiconductor material. Secondly, the J-V characteristic curves of semiconductor material are discussed in this paper. In order to achieve the current-voltage characteristic for specific junction field effect transistor, numerical values of each parameter which are included in analysis are defined and then these resultant values are predicted for the performance of junction field effect transistors. The computerized analyses have also mentioned in this paper.

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Journal Info

Abbrev

JournalLaMultiapp

Publisher

Subject

Aerospace Engineering Automotive Engineering Chemical Engineering, Chemistry & Bioengineering Civil Engineering, Building, Construction & Architecture Engineering

Description

International Journal La Multiapp peer reviewed, open access Academic and Research Journal which publishes Original Research Articles and Review Article, editorial comments etc in all fields of Engineering, Technology, Applied Sciences including Engineering, Technology, Computer Sciences, Architect, ...