<![CDATA[To detect defects of solar panel and understand the effect of external parameters such as fluctuations in illumination, temperature, and the effect of a type of dust on a photovoltaic (PV) panel, it is essential to plot the Ipv=f(Vpv) characteristic of the PV panel, and the simplest way to plot this I-V characteristic is to use a variable resistor. This paper presents a study of comparison and combination between two methods: capacitive and electronic loading to track I-V characteristic. The comparison was performed in terms of accuracy, response time and instrumentation cost used in each circuit, under standard temperature and illumination conditions by using polycrystalline solar panel type SX330J and monocrystalline solar panels type ET-M53630. The whole system is based on simple components, less expensive and especially widely used in laboratories. The results will be between the datasheet of the manufacturer with the experimental data, refinements and improvements concerning the number of points and the trace time have been made by combining these two methods.]]>
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