Atom Indonesia Journal
Vol 36, No 3 (2010): December 2010

Diffraction Plane Dependence of Micro Residual Stresses in Uniaxially Extended Carbon Steels

T. Hanabusa (Faculty of Engineering, The University of Tokushima, Minami-Josanjima, Tokushima, Japan)
A. Shiro (Graduate School of Advanced Technology and Science, The University of Tokushima, Minami- Josanjima, Tokushima, Japan)
M. Refai (Center for Technology of Nuclear Industry Materials, National Nuclear Energy Agency Puspiptek, Serpong, Tangerang 15314, Indonesia)
M. Nishida (Kobe-Kosen, Gakuen-Higashi, Kobe, Japan)



Article Info

Publish Date
09 Sep 2011

Abstract

In the stress measurement using X-ray or neutron diffraction, an elastic anisotropy as well as a plastic anisotropy of crystal must be carefully considered. In the X-ray and neutron diffraction stress measurement for polycrystalline materials, a particular {hkl} plane is used in measuring lattice strains. The dependence of an X-ray elastic constant on a diffraction plane is a typical example caused by an elastic anisotropy of the crystal. The yield strength and the work hardening rate of a single crystal depend on a crystallographic direction of the crystal. The difference in the yield strength and the work hardening rate relating to the crystallographic direction develops different residual stresses measured on each {hkl} diffraction after plastic deformation of a polycrystalline material. The present paper describes the result of the neutron stress measurement on uniaxially extended low and middle carbon steels. A tri-axial residual stress state developed in the extended specimens was measured on different kind of {hkl} diffraction plane. The measurement on the {110}, {200} and {211} diffraction showed that residual stresses increased with increasing the plastic elongation and the residual stresses on {110} were compressive, {200} were tensile and those on {211} were the middle of the former two planes. Received: 30 September 2010; Revised: 28 October 2010; Accepted: 1 November 2010

Copyrights © 2010






Journal Info

Abbrev

aij

Publisher

Subject

Materials Science & Nanotechnology

Description

Exist for publishing the results of research and development in nuclear science and technology Starting for 2010 Atom Indonesia published three times a year in April, August, and December The scope of this journal covers experimental and analytical research in all areas of nuclear science and ...