International Journal of Electrical and Computer Engineering
Vol 13, No 3: June 2023

Multi-label learning by extended multi-tier stacked ensemble method with label correlated feature subset augmentation

Hemavati Hemavati (Siddaganga Institute of Technology)
Visweswariah Susheela Devi (Indian Institute of Science)
Ramalingappa Aparna (Siddaganga Institute of Technology)



Article Info

Publish Date
01 Jun 2023

Abstract

Classification is one of the basic and most important operations that can be used in data science and machine learning applications. Multi-label classification is an extension of the multi-class problem where a set of class labels are associated with a particular instance at a time. In a multiclass problem, a single class label is associated with an instance at a time. However, there are many different stacked ensemble methods that have been proposed and because of the complexity associated with the multi-label problems, there is still a lot of scope for improving the prediction accuracy. In this paper, we are proposing the novel extended multi-tier stacked ensemble (EMSTE) method with label correlationby feature subset selection technique and then augmenting those feature subsets while constructing the intermediate dataset for improving the prediction accuracy in the generalization phase of the stacking. The performance effect of the proposed method has been compared with existing methods and showed that our proposed method outperforms the other methods.

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Journal Info

Abbrev

IJECE

Publisher

Subject

Computer Science & IT Electrical & Electronics Engineering

Description

International Journal of Electrical and Computer Engineering (IJECE, ISSN: 2088-8708, a SCOPUS indexed Journal, SNIP: 1.001; SJR: 0.296; CiteScore: 0.99; SJR & CiteScore Q2 on both of the Electrical & Electronics Engineering, and Computer Science) is the official publication of the Institute of ...