International Journal of Electrical and Computer Engineering
Vol 14, No 4: August 2024

Assessing electromagnetic field exposure levels in multi-active reconfigurable intelligent surface assisted 5G network

Ahmed Salem, Mohammed (Unknown)
Lim, Heng Siong (Unknown)
Chua, Ming Yam (Unknown)
Alaghbari, Khaled Abdulaziz (Unknown)
Zarakovitis, Charilaos (Unknown)
Chien, Su Fong (Unknown)



Article Info

Publish Date
01 Aug 2024

Abstract

As 5G mobile networks continue to proliferate in dense urban environments, it becomes increasingly important to understand and mitigate excessive electromagnetic field (EMF) exposure. This study investigates how the downlink EMF exposure levels of 5G millimeter wave (mm-wave) mobile networks are influenced by the integration of multi-active reconfigurable intelligent surfaces (RISs), using a ray-tracing approach. Our research employs a comprehensive two-step methodology: Firstly, we introduce a new RIS-assisted 5G mm-wave network planning technique. This technique leverages a machine learning (ML) approach for the classification of multi-RIS clusters. The primary goal is to optimize coverage while minimizing the number of required RIS deployments. This is achieved by strategically placing RISs based on the ML classification, ultimately aiming to enhance network efficiency. Secondly, we conducted a thorough comparative analysis, evaluating the impact of both passive and active RISs on EMF exposure level throughout a dense urban environment. Passive RIS and active RIS differ in their adaptability to changing network conditions. The result shows that the influence of multi-active RISs on EMF exposure is significant (about 7.5 times higher) compared to passive RISs.

Copyrights © 2024






Journal Info

Abbrev

IJECE

Publisher

Subject

Computer Science & IT Electrical & Electronics Engineering

Description

International Journal of Electrical and Computer Engineering (IJECE, ISSN: 2088-8708, a SCOPUS indexed Journal, SNIP: 1.001; SJR: 0.296; CiteScore: 0.99; SJR & CiteScore Q2 on both of the Electrical & Electronics Engineering, and Computer Science) is the official publication of the Institute of ...