International Journal of Electrical and Computer Engineering
Vol 14, No 3: June 2024

Pairwise test case generation with harmony search, one-parameter-at-at-time, seeding, and constraint mechanism integration

Aminu Muazu, Aminu (Unknown)
Hashim, Ahmad Sobri (Unknown)
Maiwada, Umar Danjuma (Unknown)
Isma'ila, Umar Audi (Unknown)
Yakubu, Muhammad Muntasir (Unknown)
Abubakar Ibrahim, Muhammad (Unknown)



Article Info

Publish Date
01 Jun 2024

Abstract

Pairwise testing is a method for identifying defects through combinatorial analysis. It involves testing all possible combinations of input parameters in pairs within a system, ensuring that each pair is tested at least once. The field of test case generation is highly active in the realm of combinatorial interaction testing. Research in this area is particularly encouraged, as it falls under the category of non-deterministic polynomial-time hardness. A big challenge in this field is the combinatorial explosion problem. It is about finding the best test suite that covers all possible combinations of interaction strength. In this paper, we present the task of discovering a pairwise test set as a search problem and introduce an innovative testing tool referred to as pairwise test case generation in harmony search algorithm with seeding and constraint mechanism (PHOSC). Experimental results show that PHOSC performs better compared to some existing pairwise strategies in terms of test suite size. Additionally, PHOSC provides a comprehensive framework and serves as a research platform for the generation of pairwise test sets employing the harmony search algorithm. It adopts an approach that focuses on one parameter at a time (OPAT) and incorporates seeding and constraint mechanisms at the same time, thereby enhancing the efficiency and effectiveness of the testing process.

Copyrights © 2024






Journal Info

Abbrev

IJECE

Publisher

Subject

Computer Science & IT Electrical & Electronics Engineering

Description

International Journal of Electrical and Computer Engineering (IJECE, ISSN: 2088-8708, a SCOPUS indexed Journal, SNIP: 1.001; SJR: 0.296; CiteScore: 0.99; SJR & CiteScore Q2 on both of the Electrical & Electronics Engineering, and Computer Science) is the official publication of the Institute of ...