Komunikasi Fisika Indonesia
Vol 13, No 12 (2016)

KARAKTERISASI DAN SIMULASI DIODA PN MEMPERGUNAKAN ALAT UJI OTOMATIS BERBASIS MIKROKONTROLER ATMEGA8A

Oktavia, Dian Putri (Unknown)
Hamzah, Yanuar (Unknown)
Umar, Lazuardi (Unknown)



Article Info

Publish Date
24 May 2016

Abstract

An automated test platform for I-U curve diode characterisation based on microcontroller of Atmega8A is presented. Four types of diodes; 1N4007, 1N5401, 1N5392, and 1N4148 were characterized at temperature 303K using step voltage (dU) of 1mV, 5mV, 10mV, 20mV, 50mV, 100mV, and 500mv respectively. The temperature influences on diode was observed by putting diodes in adiabatic temperature chamber at three different temperatures of 313K, 323K, and 333K, the I-U curve of diodes are then measured. The results show an exponentially diodes I-U curve at quadrant I (forward bias region). For diode parameters, the I-U curve were then modeled and simulated after diodes equation and resulted an maximum absolute error 10.57% of full scale measurement

Copyrights © 2016






Journal Info

Abbrev

JKFI

Publisher

Subject

Earth & Planetary Sciences Electrical & Electronics Engineering Energy Materials Science & Nanotechnology Physics

Description

KFI mempublikasikan artikel hasil penelitian dan review pada bidang fisika, namun tidak terbatas, yang meliputi fisika murni, geofisika, plasma, optik dan fotonik, instrumentasi, dan elektronika, dan fisika terapan (aplikasi ...