Journal of Novel Engineering Science and Technology
Vol. 3 No. 03 (2024): Journal of Novel Engineering Science and Technology

Transparent Film Profiling and Analysis by White Light Scanning Interferometry

Hlaing, Nway Nway (Unknown)
Win, Lei Lei Yin (Unknown)
Tun, Hla Myo (Unknown)
Pradhan, Devasis (Unknown)

Article Info

Publish Date
14 Jun 2024

Abstract

This paper describes the use of white light scanning interferometry with a Super luminescent diode (SLD) for thin film surface measurement. The technique provides 3D top surface and thickness profiles of transparent films, as well as detailed properties of multilayer film stacks, including material optical properties. The setup involves splitting a laser beam with a beam splitter, generating interference signals detected by a photodetector, and then converting analog signals to digital using an A/D converter for further analysis with LabView and MATLAB software. In this paper, the theoretical analysis and simulation study of white light scanning interferometry for transparent film measurement is discussed. This approach offers a flexible tool for both engineering and structured surface measurements.

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Journal Info
Journal of Novel Engineering Science and Technology
Website

Abbrev

JNEST

Publisher

Indonesian Institute of Science and Technology Research

Subject

Computer Science & IT Control & Systems Engineering Decision Sciences, Operations Research & Management Environmental Science Mechanical Engineering

Description

Journal of Novel Engineering Science and Technology is a multi-disciplinary international open-access journal dedicated to natural science, technology, and engineering, as well as its derived applications in various fields. JNEST publishes high-quality original research articles and reviews in all ...