Vertex
Vol. 11 No. 2 (2022): June: Engineering

Optimizing face sensor-based attendance system using wavelet method for enhanced security and efficiency

Priya Shimizu (Meiji University, Tokyo, Japan)
Hagihara Kobatake (Meiji University, Tokyo, Japan)
Subasi Tziritas Ezema (Meiji University, Tokyo, Japan)
Maiti Eneh Bhanot (Iowa State University of Science and Technology, Ames, USA)
Das Junior (Iowa State University of Science and Technology, Ames, USA)



Article Info

Publish Date
30 Jun 2022

Abstract

In today’s digital era, efficient and accurate attendance management is essential in various sector. This research presents an innovative approach in the development of facial sensor-based attendance systems using the wavelet method. This approach aims to address the challenges of recognizing faces under varying lighting conditions, rotations, and facial details. Image pre-processing is used to improve the quality of the face image, followed by a discrete wavelet transform to decompose the image into wavelet coefficients at various scales. This model is strengthened by strong security techniques, considering the importance of individual data privacy. This research offers a modern alternative in attendance management by utilizing facial recognition technology and the wavelet method. Although the mathematically formulated model provides a clear framework, practical implementation requires advanced techniques in image processing and artificial intelligence.

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Journal Info

Abbrev

Vertex

Publisher

Subject

Aerospace Engineering Automotive Engineering Chemical Engineering, Chemistry & Bioengineering Civil Engineering, Building, Construction & Architecture Computer Science & IT Control & Systems Engineering Electrical & Electronics Engineering

Description

Articles published in Vertex include original scientific research results (top priority), new scientific review articles (non-priority), or comments or criticisms on scientific papers published by Vertex. The journal accepts manuscripts or articles in the field of engineering from various academics ...