Best : Journal of Applied Electrical, Science and Technology
Vol 7 No 2 (2025): BEST

Integration of Concatenated Deep Learning Models with ResNet Backbone for Automated Corn Leaf Disease Identification

imam sudianto, Achmad (Unknown)
Sigit Susanto Putro (Unknown)
Eka Mala Sari (Unknown)
Ika Oktavia Suzanti (Unknown)
Aeri Rachmad (Unknown)
Wildan Surya Wijaya (Unknown)



Article Info

Publish Date
07 Oct 2025

Abstract

Corn is one of Indonesia's food commodities, which is an alternative food that supports food diversification in Indonesia. However, leaf infections in corn plants often cause significant yield losses and threaten food security. Early detection of this disease is very important, especially for small farmers, because conventional diagnostic methods that rely on agronomists are expensive and time-consuming. Recent advances in Agricultural Artificial Intelligence (AI) and image processing have facilitated automatic plant disease recognition through Convolutional Neural Networks (CNN), with ResNet as the main backbone combined through concatenation with MobileNetV3, DenseNet161, and GoogleNet. The dataset consists of 4,000 images divided into 2,560 training data, 640 validation data, and 800 test data, with image sizes adjusted to 224×224 pixels. The dataset consists of 4,000 images distributed across four categories: gray leaf spot, common rust, northern leaf blight, and healthy leaf. The testing was conducted using three different optimizers, namely Adam, RMSprop, and SGD, with a learning rate of 0.01. The experimental results showed that the SGD optimizer provided the best performance with a loss value of 0.2275, accuracy of 0.9513, precision of 0.9536, recall of 0.9513, and F1-score of 0.9512. These findings confirm that the combination of ResNet, MobileNetV3, DenseNet161, and GoogleNet architectures with the SGD optimizer can significantly improve the accuracy of corn leaf disease detection, making it a potential application for automatic detection systems in support of smart farming practices.

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Journal Info

Abbrev

best

Publisher

Subject

Computer Science & IT Control & Systems Engineering Electrical & Electronics Engineering Engineering Physics

Description

A Journal that contain Applied Electrical, Science & Technology. Published twice a year, in March and September. P-ISSN: 2715-2871(print), and E-ISSN: 2714-5247 ...