Bulletin of Electrical Engineering and Informatics
Vol 15, No 3: June 2026

Cocoon quality assessment and silk yield estimation YOLOv8 and EfficientNet-B0

Shivananda Shivanna (Visvesvaraya Technological University)
Lincy Meera Mathews (Visvesvaraya Technological University)
Omraj Ravindra Bhalke (Visvesvaraya Technological University)
Aryan Vats (Visvesvaraya Technological University)
Krrish Agrawal (Visvesvaraya Technological University)
Aditya Singh (Visvesvaraya Technological University)



Article Info

Publish Date
01 Jun 2026

Abstract

Silk production depends heavily on accurate cocoon grading, yet manual inspection is slow, inconsistent, and varies between operators. This creates problems in quality control and affects the final yield of raw silk. To address this, we present an automated system that uses computer vision to detect, separate, and grade silk cocoons without human involvement. The system combines a you only look once version 8 (YOLOv8) model for segmenting individual cocoons from tray images and an EfficientNetB0 classifier for identifying defects across six categories, including one qualified class and five defect types. After detection and grading, the pipeline also estimates the percentage of good cocoons and predicts silk yield based on standard industry measures. The model was trained on 3,068 cocoon samples and achieved 96.1% mean average precision (mAP) for segmentation and 97% accuracy for classification. The system can count cocoons, assess quality distribution, and provide batch-level yield estimates. This automated approach improves reliability, reduces manual effort, and offers consistent grading suitable for both farm-level and industrial environments. With low operating cost and simple deployment, the system supports modern, scalable, and data-driven sericulture.

Copyrights © 2026






Journal Info

Abbrev

EEI

Publisher

Subject

Electrical & Electronics Engineering

Description

Bulletin of Electrical Engineering and Informatics (Buletin Teknik Elektro dan Informatika) ISSN: 2089-3191, e-ISSN: 2302-9285 is open to submission from scholars and experts in the wide areas of electrical, electronics, instrumentation, control, telecommunication and computer engineering from the ...