TELKOMNIKA (Telecommunication Computing Electronics and Control)
Vol 23, No 2: April 2025

Advanced crop yield prediction using machine learning and deep learning: a comprehensive review

Ayush Anand (Manipal University Jaipur)
Kavita Jhajharia (Manipal University Jaipur)



Article Info

Publish Date
01 Apr 2025

Abstract

The advancement of machine learning (ML) and deep learning (DL) techniques has significantly improved crop yield prediction, making it more accurate and reliable. In this review, the implementation of ML and DL algorithms for crop yield prediction is thoroughly investigated, focusing on their crucial role in enhancing crop productivity. Along with ML and DL algorithms examine, the review analyses the use of remote sensing technologies, such as satellite and drone data, in providing high-resolution inputs essential for accurate yield predictions. The study identifies the state of art algorithms, most used features, data sources and evaluation metrics, providing a comparison of ML and DL. The findings indicate that DL models are more effective with large datasets, while ML models remain robust for smaller datasets. The future directions are proposed to develop the generalised models for different crops and regions. The review aims to assist researchers by summarising state of art techniques and identifying the present.

Copyrights © 2025






Journal Info

Abbrev

TELKOMNIKA

Publisher

Subject

Computer Science & IT

Description

Submitted papers are evaluated by anonymous referees by single blind peer review for contribution, originality, relevance, and presentation. The Editor shall inform you of the results of the review as soon as possible, hopefully in 10 weeks. Please notice that because of the great number of ...