Intechno Journal : Information Technology Journal
Vol. 8 No. 1 (2026): July

Sugarcane Plant Disease Classification Based on Leaf Image Using ConvNeXt V2 Deep Learning Model

Agung Indra (Universitas Islam Indragiri)
Fitri Yunita (Universitas Islam Indragiri)
Usman Usman (Universitas Islam Indragiri)



Article Info

Publish Date
31 Jul 2026

Abstract

Sugarcane plant diseases pose a significant threat to agricultural productivity, yet early and accurate identification remains challenging for farmers due to the limitations of manual inspection. This study proposes a sugarcane leaf disease classification system using ConvNeXt V2 Tiny, a modern convolutional architecture with a Global Response Normalization (GRN) mechanism, combined with an ensemble Stratified K-Fold Cross Validation strategy (K=6) to improve generalization on real-world field data. A dataset of 2,948 leaf images spanning five classes (Red Rot, Mosaic, Rust, Yellow Leaf, and Healthy) was used, with field-collected images held out as a fixed test set. The ensemble model achieved a mean validation accuracy of 98.49% ± 0.58% across six folds and a test accuracy of 98.39% on 427 unseen field images, with macro-average precision, recall, and F1-score each reaching 98%. ConvNeXt V2 Tiny substantially outperformed ResNet-50 (87.35%) and EfficientNetV2-S (83.37%) under identical experimental settings, demonstrating superior generalization across the domain gap between curated and field data. The primary contribution of this study is the first application of ConvNeXt V2 Tiny with ensemble K-Fold strategy for sugarcane disease classification, offering high accuracy with moderate computational complexity (28.6M parameters) and practical deployability, as demonstrated through the SugarScan web application.

Copyrights © 2026






Journal Info

Abbrev

intechno

Publisher

Subject

Computer Science & IT Control & Systems Engineering Decision Sciences, Operations Research & Management Electrical & Electronics Engineering Engineering

Description

Intechno Journal (e-ISSN 2655-1438 | p-ISSN 2655-1632) published by Universitas Amikom Yogyakarta in collaboration with Indonesian Computer, Electronics and Instrumentation Support Society (IndoCEISS) to promote high-quality Information Technology (IT) research among academics and practitioners ...