Bulletin of Electrical Engineering and Informatics
Vol 15, No 4: August 2026

Early detection of autism spectrum disorder through hybrid deep learning and classical machine learning approaches

Khairina Ahmad Khair, Aina (Unknown)
Mohd Yaakob Wan Bejuri, Wan (Unknown)
Murtadha Mohamad, Mohd (Unknown)
Kadar, Masne (Unknown)
Kadim, Zulaikha (Unknown)
Sh-Hussain, Hadrina (Unknown)
Wahyuni, Deasy (Unknown)
Kasmin, Fauziah (Unknown)
Hea Choon, Ngo (Unknown)
Jaya Kumar, Yogan (Unknown)



Article Info

Publish Date
01 Aug 2026

Abstract

Early detection of autism spectrum disorder (ASD) is essential for timely intervention. This study presents a hybrid artificial intelligence framework for non-invasive ASD pre-screening using children’s coloring, drawing, and handwriting activities. The proposed framework combines deep convolutional neural networks (VGG16, ResNet50, and EfficientNetB0) as feature extractors with a support vector machine (SVM) classifier to distinguish four diagnostic categories: non-ASD, mild ASD, moderate ASD, and severe ASD. Experimental results demonstrate task-specific performance across architectures. ResNet50–SVM achieved perfect classification for coloring tasks, with 100% accuracy, precision, recall, and F1-score. VGG16–SVM performed best for drawing, achieving 88% accuracy and recall, 89% precision, and an F1-score of 87%. EfficientNetB0–SVM produced the highest handwriting performance, achieving 96% across all evaluation metrics. These findings demonstrate the potential of computer vision-based analysis of children’s expressive activities as an effective, non-invasive ASD pre-screening tool. Future work will focus on expanding dataset diversity and integrating multimodal behavioral cues to improve model generalization and clinical applicability.

Copyrights © 2026






Journal Info

Abbrev

EEI

Publisher

Subject

Electrical & Electronics Engineering

Description

Bulletin of Electrical Engineering and Informatics (Buletin Teknik Elektro dan Informatika) ISSN: 2089-3191, e-ISSN: 2302-9285 is open to submission from scholars and experts in the wide areas of electrical, electronics, instrumentation, control, telecommunication and computer engineering from the ...