Journal of Computer Science and Informatics Engineering
Vol 5 No 4 (2026)

Sieva: K-Means And 360-Degree Feedback For Sugarcane Harvest Evaluation at PTPN II Kwala Madu

Muhammad Zarwin Syahputra (Universitas Islam Negeri Sumatera Utara)
Raissa Amanda Putri (Universitas Islam Negeri Sumatera Utara)
Muhamad Alda (Universitas Islam Negeri Sumatera Utara)



Article Info

Publish Date
11 Oct 2026

Abstract

Sugarcane harvest yields at PT Perkebunan Nusantara II (PTPN II) Kwala Madu often fall short of targets, and harvest evaluation is still largely manual, slow, and open to subjective bias. This study developed SIEVA, a web-based harvest evaluation information system that combines two evaluation perspectives: K-Means clustering of plot-level average harvest results (outcome-based) and 360-Degree Feedback on employee competencies (competency-based). The system was built with the Rapid Application Development model using PHP and MySQL, based on weighing-station records and employee assessment data collected from September 2022 to April 2023. K-Means with three clusters (good, fair, and poor) grouped 30 plots into 10, 11, and 9 plots after five iterations, with final centroids of 5,812, 5,278, and 4,601 [VERIFY FROM SIEVA OUTPUT: the reported centroids and the Silhouette and Davies–Bouldin indices must be checked against the final system output before submission.]. Black-box testing by one expert across ten function groups indicated that the functions performed as specified. The contribution is applied: an information-system model that digitalizes outcome-based and competencybased evaluation in plantation operations, not a new algorithm. Quantitative validation of the cluster structure, tests with more users, and evidence of the system's effect on management decisions remain future work.

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Journal Info

Abbrev

cosie

Publisher

Subject

Computer Science & IT

Description

Artificial Intelligence Machine Learning Natural Language Processing Computer Vision Text Speech Text Mining Data mining Cryptography Data visualization Expert System Deep Learning Fuzzy Logic IoT and smart environments Neural Networks Pattern Recognition Image Processing Optimization Digital Signal ...