Article Per Year (5 Year)
p-Index From 2021 - 2026
0.339
P-Index
This Author published in this journals
All Journal TELKOMNIKA (Telecommunication Computing Electronics and Control)
Yahaya Zakariyau Bala
Universiti Putra Malaysia
Computer Science & IT

Published : 1 Documents Claim Missing Document
Claim Missing Document
Check
Articles

Found 1 Documents
Search

 1 
The influence of machine learning on the predictive performance of cross-project defect prediction: empirical analysis Yahaya Zakariyau Bala; Pathiah Abdul Samat; Khaironi Yatim Sharif; Noridayu Manshor
TELKOMNIKA (Telecommunication Computing Electronics and Control) Vol 22, No 4: August 2024
Publisher : Universitas Ahmad Dahlan

Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.12928/telkomnika.v22i4.25916

Abstract

This empirical investigation delves into the influence of machine learning (ML) algorithms in the realm of cross-project defect prediction, employing the AEEEEM dataset as a foundation. The primary objective is to discern the nuanced influences of various algorithms on predictive performance, with a specific focus on the F1 score metric as evaluation criterion. Four ML algorithms have been carefully assessed in this study: random forest (RF), support vector machines (SVM), k-nearest neighbors (KNN), and logistic regression (LR). The choice of these algorithms reflects their prevalence in software defect prediction literature and their diversity. Through rigorous experimentation and analysis, the investigation unveils compelling evidence affirming the superiority of RF over its counterparts. The F1 score utilized as evaluation metric, capturing the delicate balance between precision and recall, essential in defect prediction scenarios. The nuanced examination of algorithmic efficacy provides practical insights for developers and practitioners navigating the challenges of cross-project defect prediction. By leveraging the rich and diverse AEEEEM dataset, this study ensures a comprehensive exploration of algorithmic influences across varied software projects. The findings not only contribute to the academic discourse on defect prediction but also offer practical guidance for real-world application, emphasizing the pivotal role of RF as a tool in enhancing predictive accuracy and reliability.
Co-Authors Khaironi Yatim Sharif Noridayu Manshor Pathiah Abdul Samat