Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.54259/satesi.v2i2.1122
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.54259/satesi.v2i2.1129
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.51876/simtek.v8i1.230
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.51876/simtek.v8i1.244
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.5281./5217/15.jupiter.2023.04
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.5281./5230/15.jupiter.2023.04
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.5281./5320/15.jupiter.2023.04
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.55338/jpkmn.v4i2.1003
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.51876/simtek.v8i2.309
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.51876/simtek.v8i2.311