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Yusmeeraz Yusof
Universiti Teknologi Malaysia, Johor Bahru, Johor, Malaysia
Computer Science & IT Electrical & Electronics Engineering

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Characterization of Defect Induced Multilayer Graphene Marriatyi Morsin; Suhaila Isaak; Marlia Morsin; Yusmeeraz Yusof
International Journal of Electrical and Computer Engineering (IJECE) Vol 7, No 3: June 2017
Publisher : Institute of Advanced Engineering and Science

Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (335.97 KB) | DOI: 10.11591/ijece.v7i3.pp1452-1458

Abstract

A study of oxygen plasma on multilayer graphene is done with different flow rates. This is to allow a controlled amount of defect fabricated on the graphene. Results from the study showed that the intensity ratio of defect between D peak and G peak was strongly depended on the amount of oxygen flow rate thus affected the 2D band of the spectra. The inter-defect distance LD ≥ 15 nm of each sample indicated that low-defect density was fabricated. The surface roughness of the multilayer graphene also increased and reduced the conductivity of the multilayer graphene.
Co-Authors Marlia Morsin Marriatyi Morsin Suhaila Isaak