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All Journal International Journal of Electrical and Computer Engineering
T. Venkat Narayana Rao
Sreenidhi Institute of Science and Technology
Computer Science & IT Electrical & Electronics Engineering

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Crop leaf disease detection and classification using machine learning and deep learning algorithms by visual symptoms: a review Pallepati Vasavi; Arumugam Punitha; T. Venkat Narayana Rao
International Journal of Electrical and Computer Engineering (IJECE) Vol 12, No 2: April 2022
Publisher : Institute of Advanced Engineering and Science

Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.11591/ijece.v12i2.pp2079-2086

Abstract

A Quick and precise crop leaf disease detection is important to increasing agricultural yield in a sustainable manner. We present a comprehensive overview of recent research in the field of crop leaf disease prediction using image processing (IP), machine learning (ML) and deep learning (DL) techniques in this paper. Using these techniques, crop leaf disease prediction made it possible to get notable accuracies. This article presents a survey of research papers that presented the various methodologies, analyzes them in terms of the dataset, number of images, number of classes, algorithms used, convolutional neural networks (CNN) models employed, and overall performance achieved. Then, suggestions are prepared on the most appropriate algorithms to deploy in standard, mobile/embedded systems, Drones, Robots and unmanned aerial vehicles (UAV). We discussed the performance measures used and listed some of the limitations and future works that requires to be focus on, to extend real time automated crop leaf disease detection system.
Co-Authors Arumugam Punitha Pallepati Vasavi