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All Journal International Journal of Electrical and Computer Engineering
Huy-Thanh Ho
Can Tho University
Computer Science & IT Electrical & Electronics Engineering

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Early detection of slight bruises in apples by cost-efficient near-infrared imaging Chanh-Nghiem Nguyen; Van-Linh Lam; Phuc-Hau Le; Huy-Thanh Ho; Chi-Ngon Nguyen
International Journal of Electrical and Computer Engineering (IJECE) Vol 12, No 1: February 2022
Publisher : Institute of Advanced Engineering and Science

Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.11591/ijece.v12i1.pp349-357

Abstract

Near-infrared (NIR) spectroscopy has been widely reported for its useful applications in assessing internal fruit qualities. Motivated by apple consumption in the global market, this study aims to evaluate the possibility of applying NIR imaging to detect slight bruises in apple fruits. A simple optical setup was designed, and low-cost system components were used to promote the future development of practical and cost-efficient devices. To evaluate the effectiveness of the proposed approach, slight bruises were created by a mild impact with a comparably low impact energy of only 0.081 Joules. Experimental results showed that 100% of bruises in Jazz and Gala apples were accurately detected immediately after bruising and within 3 hours of storage. Thus, it is promising to develop customer devices to detect slight bruises for not only apple fruits but also other fruits with soft and thin skin at their early damage stages.
Co-Authors Chanh-Nghiem Nguyen Chi-Ngon Nguyen Phuc-Hau Le Van-Linh Lam