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All Journal International Journal of Advances in Applied Sciences Bulletin of Electrical Engineering and Informatics Bulletin of Electrical Engineering and Informatics Bulletin of Electrical Engineering and Informatics
sarhan musa
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Computer Science & IT Earth & Planetary Sciences Electrical & Electronics Engineering Engineering Environmental Science Materials Science & Nanotechnology Mathematics Physics

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Magnetic Field Effect on the Electrical Characteristics of a Monocrystalline n+pp+ Silicon Solar Cell sarhan musa
International Journal of Advances in Applied Sciences Vol 3, No 4: December 2014
Publisher : Institute of Advanced Engineering and Science

Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (542.721 KB) | DOI: 10.11591/ijaas.v3.i4.pp196-201

Abstract

In this paper, the effect of magnetic field on I-V characteristics of a silicon solar cell of n+pp+ structure is studied in dark and illumination modes. In dark, both the current and the voltage decrease with increasing the magnetic field in forward bias. However in reverse bias, the behavior is different. Under illumination, the effect of magnetic field on I-V characteristics of the silicon solar cell is studied experimentally and simulated using Neural Network Algorithm (NNA). Both short circuit current (Isc) and open circuit voltage (Voc) are measured under the influence of magnetic field. The solar cell efficiency and the fill factor (FF) are calculated without and with the magnetic field. This performance testing of the solar cell under magnetic field can be considered as one of the non-destructive reliability tools.
Finite Element Approach of Shielded, Suspended and Inverted Microstrip Lines Sarhan Musa; Matthew N.O. Sadiku
Bulletin of Electrical Engineering and Informatics Vol 2, No 1: March 2013
Publisher : Institute of Advanced Engineering and Science

Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (361.512 KB) | DOI: 10.11591/eei.v2i1.255

Abstract

In this paper, we present finite element method (FEM) to investigate the electromagnetic analysis of two-dimensional (2D) shielded, suspended and inverted microstrip lines for microwave applications.  In the proposed method, we specifically determine the values of capacitance per unit length, inductance per unit length, and characteristic impedance of the microstrip lines. Extensive simulation results are presented and some comparative results are given with other methods and found them to be in excellent agreement. We extend the analysis by designing our new model of shielded, inverted microstrip lines and compared it with shielded, suspended microstrip lines; we found them to be very close. Also, we determine the quasi-TEM spectral for the potential distribution of these microstrip lines.
Finite Element Approach of Shielded, Suspended and Inverted Microstrip Lines Sarhan Musa; Matthew N.O. Sadiku
Bulletin of Electrical Engineering and Informatics Vol 2, No 1: March 2013
Publisher : Institute of Advanced Engineering and Science

Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.11591/eei.v2i1.255

Abstract

In this paper, we present finite element method (FEM) to investigate the electromagnetic analysis of two-dimensional (2D) shielded, suspended and inverted microstrip lines for microwave applications.  In the proposed method, we specifically determine the values of capacitance per unit length, inductance per unit length, and characteristic impedance of the microstrip lines. Extensive simulation results are presented and some comparative results are given with other methods and found them to be in excellent agreement. We extend the analysis by designing our new model of shielded, inverted microstrip lines and compared it with shielded, suspended microstrip lines; we found them to be very close. Also, we determine the quasi-TEM spectral for the potential distribution of these microstrip lines.
Finite Element Approach of Shielded, Suspended and Inverted Microstrip Lines Sarhan Musa; Matthew N.O. Sadiku
Bulletin of Electrical Engineering and Informatics Vol 2, No 1: March 2013
Publisher : Institute of Advanced Engineering and Science

Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (361.512 KB) | DOI: 10.11591/eei.v2i1.255

Abstract

In this paper, we present finite element method (FEM) to investigate the electromagnetic analysis of two-dimensional (2D) shielded, suspended and inverted microstrip lines for microwave applications.  In the proposed method, we specifically determine the values of capacitance per unit length, inductance per unit length, and characteristic impedance of the microstrip lines. Extensive simulation results are presented and some comparative results are given with other methods and found them to be in excellent agreement. We extend the analysis by designing our new model of shielded, inverted microstrip lines and compared it with shielded, suspended microstrip lines; we found them to be very close. Also, we determine the quasi-TEM spectral for the potential distribution of these microstrip lines.
Co-Authors Matthew N.O. Sadiku