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Engkir Sukirman
Pusat Teknologi Bahan Industri Nuklir (PTBIN) - BATAN, Kawasan Puspiptek, Serpong 15314, Tangerang Selatan
Materials Science & Nanotechnology

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ANALISIS KUALITATIF DAN KUANTITATIF FASA (Na0,5Bi0,5)TiO3 DENGAN TEKNIK DIFRAKSI SINAR-X MENGGUNAKAN METODE RIETVELD Engkir Sukirman; Syahfandi Ahda
Jurnal Sains Materi Indonesia VOL 13, NO 1: OKTOBER 2011
Publisher : Center for Science & Technology of Advanced Materials - National Nuclear Energy Agency

Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (526.588 KB) | DOI: 10.17146/jusami.2011.13.1.5403

Abstract

Co-Authors Syahfandi Ahda