Article Per Year (5 Year)
p-Index From 2020 - 2025
0
P-Index
This Author published in this journals
All Journal Jurnal Otomasi Kontrol dan Instrumentasi
D Kurnia
Unknown Affiliation
Chemical Engineering, Chemistry & Bioengineering Control & Systems Engineering Engineering Industrial & Manufacturing Engineering

Published : 1 Documents Claim Missing Document
Claim Missing Document
Check
Articles

Found 1 Documents
Search

 1 
Determination of the Dielectric Constant and the Thickness of Polymer Thin Film Based on SPR Curve Hendro Hendro; R Hidayat; D Kurnia
Jurnal Otomasi Kontrol dan Instrumentasi Vol 3 No 2 (2011): Jurnal Otomasi Kontrol dan Instrumentasi
Publisher : Pusat Teknologi Instrumentasi dan Otomasi (PTIO) - Institut Teknologi Bandung

Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.5614/joki.2011.3.2.2

Abstract

The SPR curve fitting using the Winspall simulator to determine the dielectric constant and the thickness of MEH-PPV film is presented. Experiment was performed by measuring the SPR curve of gold layer and gold/MEH-PPV layers based on Kretschmann configuration. First, the dielectric constant and the thickness of gold film are determined by fitting the SPR curve. And then the dielectric constant and the thickness of MEH-PPV are determined by fitting its SPR curve. The thickness result calculation from curve fitting for MEH-PPV shows comparable to the result from SEM. This method makes Winspall program as a simple tool in analysis and calculation to determine dielectric constant and thickness, layer by layer in deposition. Keywords:dielectric constant, MEH-PPV, SPR, Winspall, curve fitting, thickness 
Co-Authors Hendro Hendro R Hidayat