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Transition of Laboratory Management System Based on ISO/IEC 17025:2017 at SNSU-BSN Chery Chaen Putri; Melati Azizka Fajria; Adindra Vickar Ega; Eka Pratiwi; Yulita Ika Pawestri; Nelfyenny Nelfyenny; Muhammad Haekal Habibie
Instrumentasi Vol 45, No 1 (2021)
Publisher : LIPI Press, Anggota IKAPI

Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31153/instrumentasi.v45i1.256

Abstract

To accommodate current technological developments and laboratory conditions, ISO (International Organization for Standardization) and IEC (International Electrotechnical Commission) published the latest version of the ISO/IEC 17025 standard in 2017. Complying with ISO/IEC 17025:2017 enables laboratory to provide measurement results that are valid and traceable to international unit system. SNSU-BSN as National Metrology Institute (NMI) in Indonesia has transformed its management system from the old version ISO/IEC17025:2005 to the current ISO/IEC 17025:2017 in 2019. This study explains the process of SNSU-BSN transition in order to establish a management system complying with ISO/IEC 17025:2017. A comparison between the implementation of the old and the current ISO/IEC 17025 was explained along with its impacts and benefits.  This study shows that SNSU-BSN as a NMI in Indonesia has successfully implemented the full implementation of the transition from ISO/IEC 17025:2005 to ISO/IEC 17025:2017 in accordance with the time-frame determined by the Joint ILAC-ISO and KAN.
MEASUREMENT UNCERTAINTY OF THE OPTICAL WAVELENGTH CALIBRATION 633 nm BY BEAT FREQUENCY MEASUREMENT METHODS Asep Hapiddin; Yulita Ika Pawestri; A. M. Boynawan; Ratnaningsih Ratnaningsih
Instrumentasi Vol 44, No 2 (2020)
Publisher : LIPI Press, Anggota IKAPI

Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31153/instrumentasi.v44i2.220

Abstract

Measurement traceability is one of the critical aspects in metrology area. The measurement uncertainty had been evaluated to assure reliability of the optical wavelength calibration system for stabilized He-Ne laser 633 nm in SNSU-BSN. Beat frequency measurement was applied as a calibration method by utilizing KIM-1 as a reference standard that traceable to SI unit through CCL-K11 key comparison. Best measurement capability declares with a relative uncertainty of ±1.3×10-10 by excluding UUC effect. The calibration replica was performed as a validation process, dual mode laser head Agilent 5519B took a role as UUC. As calibration result, beat frequency of KIM-1 and UUC is (122.931±0.060) MHz. Among all of the uncertainty sources, KIM-1 uncertainty most significant influence to the beat frequency uncertainty and the optical wavelength of the UUC laser in vacuum condition. Based on the evaluation result, the calibration system of stabilized He-Ne laser can be validated and trace back with documented unbroken calibration chain to the primary standard of length, KIM-1 where established in SNSU-BSN.