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All Journal International Journal of Reconfigurable and Embedded Systems (IJRES) Bulletin of Electrical Engineering and Informatics
Kanagaraj Venusamy
University of Technology and Applied Sciences-AI Mussanah
Economics, Econometrics & Finance Electrical & Electronics Engineering

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Machine to machine communication enabled internet of things: a review Rajagopal Sudarmani; Kanagaraj Venusamy; Sathish Sivaraman; Poongodi Jayaraman; Kannadhasan Suriyan; Manjunathan Alagarsamy
International Journal of Reconfigurable and Embedded Systems (IJRES) Vol 11, No 2: July 2022
Publisher : Institute of Advanced Engineering and Science

Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.11591/ijres.v11.i2.pp126-134

Abstract

Internet of things (IoT) will be the main part in upcoming generation devices that would not simply sense and report, also will have the controlling capability. It may be a connected vehicle, connected devices, robot, a building automation system, a door lock or a thermostat, these connected machines or devices will provide greater impact on our daily lives. Control data and the operating instructions could be protected to ensure control and autonomy for our safety and security, this could be a critical task. Privacy and security are important consideration in designing the system. With the intense growth of devices or devices with facilities such as computing and communication are carried out using a profound technology known as machine to machine (M2M) communication, which is specially designed for cross‐platform integration. In many industries, smart homes, smart cities, smart agriculture, government, connected devices, security, healthcare, education, public safety, and supply chain management. Internet of things (IoT) and machine to machine communication have to be implemented in near future. Also, this paper gives an in depth view about the different M2M techniques with interconnected IoT for truly connected, smart, and sustainable world.
Power analyzer of linear feedback shift register techniques using built in self test Kannadhasan Suriyan; Nagarajan Ramalingam; Kanagaraj Venusamy; Sathish Sivaraman; Kiruthiga Balasubramaniyan; Manjunathan Alagarsamy
Bulletin of Electrical Engineering and Informatics Vol 11, No 2: April 2022
Publisher : Institute of Advanced Engineering and Science

Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.11591/eei.v11i2.3331

Abstract

Wasteful patterns that don't lead to fault dropping squander a tone of energy in the linear-feedback shift register and circuit under examination in a random research region. Random switching actions in the CUT and scan pathways between applications with two consecutive vectors are another significant cause of energy loss. This study proposes a unique built-in self-test (BIST) technique for scan-based circuits that might help save energy. Only the available vectors are produced in a fixed series thanks to a mapping logic that alters the LFSR's state transitions. As a consequence, and without reducing fault coverage, the time it takes to execute trials has decreased. Experiments on circuits demonstrated that during random testing, the linear feedback shift register saves a significant amount of power.
Co-Authors Kannadhasan Suriyan Kannadhasan Suriyan Kiruthiga Balasubramaniyan Manjunathan Alagarsamy Manjunathan Alagarsamy Nagarajan Ramalingam Poongodi Jayaraman Rajagopal Sudarmani Sathish Sivaraman