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XU He
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Field Distribution of Environment and Vibration Chamber WANG Tong; GUAN Yin; LIANG Qiong-chong; XU He
Indonesian Journal of Electrical Engineering and Computer Science Vol 10, No 3: July 2012
Publisher : Institute of Advanced Engineering and Science

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Abstract

Environment and vibration test system can test equipment such as radars in full load condition. Environment and vibration chamber is an opening rectangular cavity. In order to study the field distribution of environment and vibration chamber, the open rectangular cavity field distribution and parabolic antenna are analyzed by using the Dyadic Green’s functions. According to the Dyadic Green’s functions, the field distribution of environment and vibration chamber is concluded by MATLAB. The simulation result of FEKO proves that the method by using Dyadic Green’s functions is available. The innovation of this article is using the Dyadic Green’s functions to analyzed open cavity field and parabolic antenna. DOI: http://dx.doi.org/10.11591/telkomnika.v10i3.620
Impacts of Life Distributions on Reliability Analysis of Smart Substations Ji-pu Gao; Xu He; Changbao Xu
Indonesian Journal of Electrical Engineering and Computer Science Vol 12, No 4: April 2014
Publisher : Institute of Advanced Engineering and Science

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Abstract

Most of the existing reliability analysis is based on exponential distribution which is convenient to calculation, whereas most intelligent electronic devices exhibit Weibull distribution. What kind of influence will life distribution have on the reliability and availability of a smart substation. This paper compares the reliability and availability of systems with different life distributions based on reliability block diagram and Monte-Carlo simulation, by treating the smart substations as non-repairable and repairable systems respectively. Simulation results proves the feasibility of substituting Weibull distribution with exponential distribution in engineering practice when the smart substations are treated as repairable systems, thus the life data estimation as well as the reliability analysis and calculation will be greatly simplified. DOI : http://dx.doi.org/10.11591/telkomnika.v12i4.4833
Co-Authors Changbao Xu GUAN Yin Ji-pu Gao LIANG Qiong-chong WANG Tong