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ZHAO Qian
Beijing Institution of Technology

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Software reliability modeling with testing-effort function and imperfect debugging ZHAO Qian; ZHENG Jun; LI Jing
Indonesian Journal of Electrical Engineering and Computer Science Vol 10, No 8: December 2012
Publisher : Institute of Advanced Engineering and Science

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Abstract

Considering testing effort and imperfect debugging in reliability modeling process may further improve the fitting and prediction results of software reliability growth models (SRGMs). For describing the S-shaped varying trend of the testing-effort increasing rate more accurately, this paper first proposes a inflected S-shaped testing effort function (IS-TEF). Then this new TEF is incorporated into the inflected S-shaped NHPP SRGMs for obtaining a new NHPP SRGMs which consider S-shaped TEF (IS-TEFM-IS). We further discuss this new NHPP SRGM with two imperfect-debugging assumptions to propose two new NHPP SRGMs, i.e. IS-TEFM-IS-ID1 and IS-TEFM-IS-ID2. Finally these three new NHPP SRGMs and several comparison NHPP SRGMs are applied into two real failure data-sets respectively for investigating the fitting power of the IS-TEFM-IS, IS-TEFM-IS-ID1 and IS-TEFM-IS-ID2. The experimental results show that the inflected S-shaped NHPP SRGMs considering IS-TEF and imperfect indeed can yield the best accurate estimation results than the other comparison SRGMs. DOI: http://dx.doi.org/10.11591/telkomnika.v10i8.1630
Co-Authors LI Jing ZHENG Jun