Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.55606/jitek.v2i3.614
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.55606/jitek.v2i3.773
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.214541/te8e3z16
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.214541/2ps4sp84
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31222/de11gq54
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31222/y8zpym57
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.214543/g728bv71
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.214548/hm6xtn85
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.58290/jukomtek.v4i1.304
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.58290/jukomtek.v4i1.305