Article Per Year (5 Year)
p-Index From 2021 - 2026
0.23
P-Index
This Author published in this journals
All Journal Bulletin of Electrical Engineering and Informatics
Fatimah S. Abdulsattar
Mustansiriyah University
Electrical & Electronics Engineering

Published : 1 Documents Claim Missing Document
Claim Missing Document
Check
Articles

Found 1 Documents
Search

 1 
K-mean clustering and local binary pattern techniques for automatic brain tumor detection Faiq Sabbar Baji; Saleema Baji Abdullah; Fatimah S. Abdulsattar
Bulletin of Electrical Engineering and Informatics Vol 12, No 3: June 2023
Publisher : Institute of Advanced Engineering and Science

Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.11591/eei.v12i3.4404

Abstract

Tumors in brains are caused by the unregulated emergence of tissue cells inside the brain. The early diagnosis and determining the precise location of the tumor in magnetic resonance imaging (MRI) and its size are essential for the teams of physicians. Image segmentation is often considered a preliminary step in medical image analyses. K-means clustering has been widely adopted for brain tumor detection. The result of this technique is a list of cluster images. The challenge of this method is the difficulty of selecting the appropriate cluster section that depicts the tumor. In this work, we analyze the influence of different image clusters. Each cluster is then split into the left and right parts. After that, the texture features are depicted in each part. Furthermore, the bilateral symmetry measure is applied to estimate the cluster that contains the tumor. Finally, the connected component labeling is employed to determine the target cluster for brain tumor detection. The developed technique is applied to 30 MRI images. The encouraging accuracy of 87% is obtained.
Co-Authors Faiq Sabbar Baji Saleema Baji Abdullah