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All Journal International Journal of Electrical and Computer Engineering
Marwa Awni
Tishk International University
Computer Science & IT Electrical & Electronics Engineering

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Arduino based 74-series integrated circuits testing system at gate level Yasir Hashim; Marwa Awni; Abdullah Mufeed
International Journal of Electrical and Computer Engineering (IJECE) Vol 13, No 5: October 2023
Publisher : Institute of Advanced Engineering and Science

Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.11591/ijece.v13i5.pp4950-4957

Abstract

The goal of this research article is to build and implement a low-cost, user-friendly 74-series logic integrated circuits (ICs) tester that is independent of a computer. Depending on the truth table of the gates and the IC configuration, the logic IC tester will be able to test the operation of the 74 series logic gates (AND, OR, NOR, NAND, XOR) of those ICs. It is feasible to test a range of logic ICs with higher pin widths thanks to the proposed system’s usage of an Arduino Mega platform module as a microcontroller, which provides the ability to connect 54 programmed logic inputs or outputs. The versatility offered by this design and the use of a personal computer allow for the reprograming and updating of the logic IC functional tester. Any 74-series ICs testing outcome will be shown on liquid crystal display (LCD) at the gate level. The logic IC functional tester was successfully constructed and operates flawlessly.
Co-Authors Abdullah Mufeed Yasir Hashim