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All Journal International Journal of Electrical and Computer Engineering
Gowda Ganashree, Kamenahalli Chandre
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Computer Science & IT Electrical & Electronics Engineering

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Land scene classification from remote sensing images using improved artificial bee colony optimization algorithm Gowda Ganashree, Kamenahalli Chandre; Hemavathy, Ramakrishna; Ramakrishna Anala, Maddur
International Journal of Electrical and Computer Engineering (IJECE) Vol 14, No 1: February 2024
Publisher : Institute of Advanced Engineering and Science

Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.11591/ijece.v14i1.pp347-357

Abstract

The images obtained from remote sensing consist of background complexities and similarities among the objects that act as challenge during the classification of land scenes. Land scenes are utilized in various fields such as agriculture, urbanization, and disaster management, to detect the condition of land surfaces and help to identify the suitability of the land surfaces for planting crops, and building construction. The existing methods help in the classification of land scenes through the images obtained from remote sensing technology, but the background complexities and presence of similar objects act as a barricade against providing better results. To overcome these issues, an improved artificial bee colony optimization algorithm with convolutional neural network (IABC-CNN) model is proposed to achieve better results in classifying the land scenes. The images are collected from aerial image dataset (AID), Northwestern Polytechnical University-Remote Sensing Image Scene 45 (NWPU-RESIS45), and University of California Merced (UCM) datasets. IABC effectively selects the best features from the extracted features using visual geometry group-16 (VGG-16). The selected features from the IABC are provided for the classification process using multiclass-support vector machine (MSVM). Results obtained from the proposed IABC-CNN achieves a better classification accuracy of 96.40% with an error rate 3.6%.
Co-Authors Hemavathy, Ramakrishna Ramakrishna Anala, Maddur