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All Journal International Journal of Electrical and Computer Engineering
Akmal Dzulkifli, Fahmi
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Computer Science & IT Electrical & Electronics Engineering

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An introduction to double stain normalization technique for brain tumour histopathological images Akmal Dzulkifli, Fahmi; Yusoff Mashor, Mohd; A. Raof, Rafikha Aliana; Jaafar, Hasnan
International Journal of Electrical and Computer Engineering (IJECE) Vol 14, No 1: February 2024
Publisher : Institute of Advanced Engineering and Science

Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.11591/ijece.v14i1.pp375-388

Abstract

Stain normalization is an image pre-processing method extensively used to standardize multiple variances of staining intensity in histopathology image analysis. Staining variations may occur for several reasons, such as unstandardized protocols while preparing the specimens, using dyes from different manufacturers, and varying parameters set while capturing the digital images. In this study, a double stain normalization technique based on immunohistochemical staining is developed to improve the performance of the conventional Reinhard’s algorithm. The proposed approach began with preparing a target image by applying the contrast-limited adaptive histogram equalization (CLAHE) technique to the targeted cells. Later, the colour distribution of the input image will be matched to the colour distribution of the target image through the linear transformation process. In this study, the power-law transformation was applied to address the over-enhancement and contrast degradation issues in the conventional method. Five quality metrics comprised of entropy, tenengrad criterion (TEN), mean square error (MSE), structural similarity index (SSIM) and correlation coefficient were used to measure the performance of the proposed system. The experimental results demonstrate that the proposed method outperformed all conventional techniques. The proposed method achieved the highest average values of 5.59, 3854.11 and 94.65 for entropy, TEN, and MSE analyses.
Co-Authors A. Raof, Rafikha Aliana Jaafar, Hasnan Yusoff Mashor, Mohd