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All Journal IAES International Journal of Artificial Intelligence (IJ-AI)
Poojary, Sanjana
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Computer Science & IT Engineering

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A survey of detecting leaf diseases using machine learning and deep learning in various crops Thangamuthu, Thilagraj; Kareem, Abdul; Kumara, Varuna; Udesh Naik, Utkrishna; Poojary, Sanjana; R, Bharath
IAES International Journal of Artificial Intelligence (IJ-AI) Vol 13, No 3: September 2024
Publisher : Institute of Advanced Engineering and Science

Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.11591/ijai.v13.i3.pp2498-2505

Abstract

For agricultural productivity and food security to be guaranteed, early detection and treatment of illnesses are crucial. Machine learning (ML) and deep learning (DL) approaches can be used to precisely and successfully identify plant leaf diseases. A heterogeneous dataset comprising photos of both healthy and diseased leaves such as bacterial blights, fungal infections, and viral manifestations provides the foundation for the model building and training. Accuracy, precision, recall, and F1-score are the measures used to assess the model's performance. ML techniques are helpful in the identification and extraction of pertinent information from plant leaf pictures, whereas DL techniques in general, and convolutional neural networks (CNN), in particular, are remarkable at learning complex hierarchical representations. Therefore, DL architectures like CNN are utilized in conjunction with ML approaches like support vector machines (SVM), decision trees, and random forests to extract complicated patterns and attributes from leaf pictures. This research provides an extensive analysis of the performance and application of DL and ML approaches recently applied to the early identification of leaf diseases in different crops.
Co-Authors Kareem, Abdul Kumara, Varuna R, Bharath Thangamuthu, Thilagraj Udesh Naik, Utkrishna