Article Per Year (5 Year)
p-Index From 2021 - 2026
0.23
P-Index
This Author published in this journals
All Journal Indonesian Journal of Electrical Engineering and Computer Science
Sukanya, Poornima Huchegowda
Unknown Affiliation

Published : 1 Documents Claim Missing Document
Claim Missing Document
Check
Articles

Found 1 Documents
Search

 1 
Mathematical model enhancing flash memory reliability through DFT-driven error correction coding Sukanya, Poornima Huchegowda; Chowdaiah, Nagaraju
Indonesian Journal of Electrical Engineering and Computer Science Vol 35, No 3: September 2024
Publisher : Institute of Advanced Engineering and Science

Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.11591/ijeecs.v35.i3.pp1468-1479

Abstract

Flash memory, ubiquitous in diverse electronic devices, confronts persistent challenges stemming from inherent errors that jeopardize data integrity. This research situates itself at the intersection of these challenges and advancements, proposing an inventive error correction coding framework that harnesses the unique capabilities of analysis with a hybrid error control coding (HECC) approach. In the proposed work, a mathematical model aimed at enhancing the flash memory by identifying the error pattern within the pages using the discrete fourier transform (DFT). By incorporating distinctive DFT mathematical properties, the proposed technique intends to improve flash memory error correction beyond traditional methods. The flash storage defect detection and rectification results with hybrid error correction coding achieved bit error rate (BER) of 4.3e-6, latency 14.1, mean 15.1 and standard deviation 1.0. Error correction efficiency 98% and storage overhead 10%. With this approach results are significantly improving the error correction efficiency, reduce storage overhead and enhanced adaptability to diverse error patterns.
Co-Authors Chowdaiah, Nagaraju