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All Journal International Journal of Power Electronics and Drive Systems (IJPEDS) Indonesian Journal of Electronics and Instrumentation Systems Techno.Com: Jurnal Teknologi Informasi Bulletin of Electrical Engineering and Informatics JUITA : Jurnal Informatika Proceeding of the Electrical Engineering Computer Science and Informatics Kinetik: Game Technology, Information System, Computer Network, Computing, Electronics, and Control Jurnal Informatika dan Rekayasa Elektronik Community Development Journal: Jurnal Pengabdian Masyarakat
Syafaah, Lailis
Universitas Muhammadiyah Malang
Humanities Computer Science & IT Control & Systems Engineering Economics, Econometrics & Finance Education Electrical & Electronics Engineering Energy Engineering Health Professions Public Health

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Journal : Kinetik: Game Technology, Information System, Computer Network, Computing, Electronics, and Control

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Effects of Process Variations in a HCMOS IC using a Monte Carlo SPICE Simulation Widianto, Widianto; Syafaah, Lailis; Nurhadi, Nurhadi
Kinetik: Game Technology, Information System, Computer Network, Computing, Electronics, and Control Vol 3, No 1, February-2018
Publisher : Universitas Muhammadiyah Malang

Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (452.746 KB) | DOI: 10.22219/kinetik.v3i1.437

Abstract

In this paper, effects of process variations in a HCMOS (High-Speed Complementary Metal Oxide Semiconductor) IC (Integrated Circuit) are examined using a Monte Carlo SPICE (Simulation Program with Integrated Circuit Emphasis) simulation. The variations of the IC are L and VTO variations. An evaluation method is used to evaluate the effects of the variations by modeling it using a normal (Gaussian) distribution. The simulation results show that the IC may be detected as a defective IC caused by the variations based on large supply currents flow to it. 
Effects of Process Variations in a HCMOS IC using a Monte Carlo SPICE Simulation Widianto Widianto; Lailis Syafaah; Nurhadi Nurhadi
Kinetik: Game Technology, Information System, Computer Network, Computing, Electronics, and Control Vol 3, No 1, February-2018
Publisher : Universitas Muhammadiyah Malang

Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (452.746 KB) | DOI: 10.22219/kinetik.v3i1.437

Abstract

In this paper, effects of process variations in a HCMOS (High-Speed Complementary Metal Oxide Semiconductor) IC (Integrated Circuit) are examined using a Monte Carlo SPICE (Simulation Program with Integrated Circuit Emphasis) simulation. The variations of the IC are L and VTO variations. An evaluation method is used to evaluate the effects of the variations by modeling it using a normal (Gaussian) distribution. The simulation results show that the IC may be detected as a defective IC caused by the variations based on large supply currents flow to it. 
Co-Authors A.A. Ketut Agung Cahyawan W Agus Heriyanto Alvian Widianto Amrul Faruq Basuki, Setio Diding Suhardi Ilham Pakaya Iqbal Abadilah Umar Irfan, M. Irfan, Muhammad Khaeruddin Khaeruddin M. Irfan M. Irfan Machmud Effendy Mauridhi Hery Purnomo Merinda Lestandy Muhammad Ibnu Alfarizi Novendra Setyawan Nur Alif Nurhadi, Nurhadi Selfi Rizkianto Sumadi, Fauzi Dwi Setiawan Widianto Widianto Widianto Widianto Widianto, Widianto Yoga Nur Firmansyah Yudawan Hidayat