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Ahmed, Mohammed Altaf
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ADKNN fostered BIST with Namib Beetle optimization algorithm espoused BISR for SoC-based devices Alnatheer, Suleman; Ahmed, Mohammed Altaf
Indonesian Journal of Electrical Engineering and Computer Science Vol 35, No 1: July 2024
Publisher : Institute of Advanced Engineering and Science

Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.11591/ijeecs.v35.i1.pp90-101

Abstract

Redundancy analysis is a widely used method in fault-tolerant memory systems, and it is essential for large-size memories. In current security operations centers (SoCs), memory occupies most of the chip space. To correct these memories using a conventional external equipment test approach is more difficult. To overcome this issue, memory creators utilize redundancy mechanism for substituting the columns and rows along with a spare one to increase output of the memories. In this study, a built-in-self-test (BIST) to test memories and built-in-self-repair (BISR) mechanism to repair the faulty cells for any recent SoC devices is proposed. The BIST, based on adaptive activation functions with a deep Kronecker neural network (ADKNN), not only detects the defect but also determines the kind of defect. The BISR block uses the Namib Beetle optimization algorithm (NBOA) to fix the mistakes in the memory under test (MUT). The study attempts to determine how the characteristics of SoC-based devices change in the real world and then contributes to the suggested controller blocks. Performance metrics such as slice register, region, delay, maximum operating frequency, power consumption, minimum clock period, and access time evaluate performance. Comparing the proposed ADKNN-NBOA-BIST-BISR scheme to existing BIST, BISR, and BISD-based methods reveals its significant performance.
Melanoma image synthesis: a review using generative adversarial networks Ahmed, Mohammed Altaf; Qureshi, Mohammad Naved; Umar, Mohammad Sarosh; Bedoui, Mouna
Indonesian Journal of Electrical Engineering and Computer Science Vol 35, No 1: July 2024
Publisher : Institute of Advanced Engineering and Science

Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.11591/ijeecs.v35.i1.pp551-569

Abstract

Melanoma is a highly malignant skin cancer that may be fatal if not promptly detected and treated. The limited availability of high-quality melanoma images, which are needed for training machine learning models, is one of the obstacles to detecting melanoma. Generative adversarial networks (GANs) have grown in popularity as a strong technique for image synthesis. This research is also targeted at the sustainable development goal (SDG) for health care. In this study, we survey existing GAN-based melanoma image synthesis methods. In this work, we briefly introduce GANs and how they may be used for generating synthetic images. Ensuring healthy lifestyles and promoting well-being for everyone, regardless of age, is the main aim. A comparative study is carried out on how GANs are used in current research to generate melanoma images and how they improve the classification performance of neural networks. Various public and proprietary datasets for training GANs in melanoma image synthesis are also discussed. Lastly, we assess the examined studies' performance using measures like the Frechet Inception distance (FID), Inception score, structural similarity ındex (SSIM), and various classification performance metrics. We compare the evaluated findings and suggest further GAN-based melanoma image-creation research.
Co-Authors Alnatheer, Suleman Bedoui, Mouna Qureshi, Mohammad Naved Umar, Mohammad Sarosh