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All Journal Journal of Applied Computer Science and Technology (JACOST)
Utama, Eldio
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Computer Science & IT

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Performance Comparison of Support Vector Machine (SVM) and k-Nearest Neighbors (kNN) in Verifying Material Orientation Utama, Eldio; Rudiawan Jamzuri, Eko
Journal of Applied Computer Science and Technology Vol 6 No 1 (2025): Juni 2025
Publisher : Indonesian Society of Applied Science

Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.52158/jacost.v6i1.1037

Abstract

In automated manufacturing, verifying material orientation is essential to ensure the product assembly proceeds without errors. For instance, in the beverage industry, incorrect orientation of materials, such as bottle caps, can lead to failures in the packaging process, resulting in improperly sealed bottles that may compromise product quality and safety. This study compares the performance of Support Vector Machine (SVM) and k-Nearest Neighbors algorithms for verifying material orientation verification through automated optical inspection. The images were processed using the Inception V3 Convolutional Neural Network (CNN) to extract relevant image features, which were then classified using SVM and kNN algorithms. As a result, SVM achieved high classification performance during testing, with classification accuracy, precision, recall, and F1 score of 1.0 compared to kNN, which achieved only 0.967. However, kNN demonstrated superior computational efficiency, with a training time of 1.126 seconds and a validation time of 0.713 seconds, compared to SVM's training time of 3.101 seconds and validation time of 1.479 seconds. These results indicate that while both methods are highly effective for material orientation verification, kNN offers significant advantages in terms of computational speed, making it more suitable for real-time applications. The implications of this study highlight the potential for integrating the proposed method in industrial applications, promoting enhanced efficiency and reducing error rates in automated assembly lines.
Co-Authors Eko Rudiawan Jamzuri