Mechatronics, Electrical Power, and Vehicular Technology
Vol 3, No 2 (2012)

A Review of Atomic Layer Deposition for Nanoscale Devices

Riyanto, Edy (Unknown)
Rijanto, Estiko (Unknown)
Prawara, Budi (Unknown)



Article Info

Publish Date
07 Dec 2012

Abstract

Atomic layer deposition (ALD) is a thin film growth technique that utilizes alternating, self-saturation chemical reactions between gaseous precursors to achieve a deposited nanoscale layers. It has recently become a subject of great interest for ultrathin film deposition in many various applications such as microelectronics, photovoltaic, dynamic random access memory (DRAM), and microelectromechanic system (MEMS). By using ALD, the conformability and extreme uniformity of layers can be achieved in low temperature process. It facilitates to be deposited onto the surface in many variety substrates that have low melting temperature. Eventually it has advantages on the contribution to the wider nanodevices.

Copyrights © 2012






Journal Info

Abbrev

mev

Publisher

Subject

Electrical & Electronics Engineering

Description

Mechatronics, Electrical Power, and Vehicular Technology (hence MEV) is a journal aims to be a leading peer-reviewed platform and an authoritative source of information. We publish original research papers, review articles and case studies focused on mechatronics, electrical power, and vehicular ...