Research of the Defect Model Based on Similarity and Association Rule

Wanjiang Han (Beijing University of Posts and Telecommunication)
Lixin Jiang (Beijing University of Posts and Telecommunication)
Xiaoyan Zhang (Beijing University of Posts and Telecommunication)
Tianbo Lu (Beijing University of Posts and Telecommunication)
Sun Yi (Beijing University of Posts and Telecommunication)
Li Yan (Beijing University of Posts and Telecommunication)
Weijian Li (Beijing University of Post and Telecommunication)

Indonesian Journal of Electrical Engineering and Computer Science
Vol 12, No 6: June 2014

In order to detect defects efficiently and improve the quality of products, this paper puts forward the concept about defect classification model and defect association model by a lot of defect data. The technology of similarity is applied to defect classification model, and the idea of Knowledge Discovery in Database is applied to defect association model. Defect classification model can analyze the defect efficiently and provides the basis of solving problems quickly while defect association model can be used to detect early and prevent problem, which can make effective improvements to testing and development. This paper summed up GUI defect model based on a large number of interface defects. The model is useful to improve the accuracy of forecast and be used for test planning and implementation through the practice of several projects. DOI : http://dx.doi.org/10.11591/telkomnika.v12i6.5452