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Wanjiang Han
Beijing University of Posts and Telecommunication

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Research on Software Fault Distribution for Web Application Wanjiang Han; Lixin Jiang; Sun Yi; Li Ye; Han Xiao; Weijian Li; Liu Chi
Indonesian Journal of Electrical Engineering and Computer Science Vol 12, No 5: May 2014
Publisher : Institute of Advanced Engineering and Science

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Abstract

This paper studies multiple software faultdistribution model, then extends the ideas of software fault estimation based on the analysis of a large number of projectfault data.Itpresents the estimation model of software faultsdistribution for Web Application, which refers to the G-O model and Rayleigh model. Thispaper fits the faultprediction model and showsthe steps to determine the relevant parameters.Firstly, estimating the probability of finding a faultaccording to similar project data.Then estimating the total number offaults. Software fault estimation model has certain directive significance to the prediction and planning projects.Experiments show that the model has great potential to predictsoftware fault. DOI : http://dx.doi.org/10.11591/telkomnika.v12i5.5116
Research of the Defect Model Based on Similarity and Association Rule Wanjiang Han; Lixin Jiang; Xiaoyan Zhang; Tianbo Lu; Sun Yi; Li Yan; Weijian Li
Indonesian Journal of Electrical Engineering and Computer Science Vol 12, No 6: June 2014
Publisher : Institute of Advanced Engineering and Science

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Abstract

In order to detect defects efficiently and improve the quality of products, this paper puts forward the concept about defect classification model and defect association model by a lot of defect data. The technology of similarity is applied to defect classification model, and the idea of Knowledge Discovery in Database is applied to defect association model. Defect classification model can analyze the defect efficiently and provides the basis of solving problems quickly while defect association model can be used to detect early and prevent problem, which can make effective improvements to testing and development. This paper summed up GUI defect model based on a large number of interface defects. The model is useful to improve the accuracy of forecast and be used for test planning and implementation through the practice of several projects. DOI : http://dx.doi.org/10.11591/telkomnika.v12i6.5452
Co-Authors Han Xiao Li Yan Li Ye Liu Chi Lixin Jiang Lixin Jiang Sun Yi Sun Yi Tianbo Lu Weijian Li Weijian Li Xiaoyan Zhang