International Journal of Applied Sciences and Smart Technologies
Volume 02, Issue 02, December 2020

RAID Level 6 and Level 6+ Reliability

Thomas Johannes Emil Schwarz (Marquette University)

Article Info

Publish Date
04 Dec 2020

Abstract

Storage systems are built of fallible components but have to provide high degrees of reliability. Besides mirroring and triplicating data, redundant storage of information using erasure-correcting codes is the only possibility to have data survive device failure.We provide here exact formula for the data-loss probability of a disk array composed of several RAID Level 6 stripes. This two-failure tolerant is not only used in practice but can also provide a reference point for the assessment of other data organizations.

Copyrights © 2020




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Journal Info
International Journal of Applied Sciences and Smart Technologies
Website

Abbrev

IJASST

Publisher

Universitas Sanata Dharma

Subject

Computer Science & IT Energy Engineering Industrial & Manufacturing Engineering

Description

International Journal of Applied Sciences and Smart Technologies (IJASST) is published by Faculty of Science and Technology, Sanata Dharma University Yogyakarta-Central Java-Indonesia. IJASST is an open-access peer reviewed journal that mediates the dissemination of academicians, researchers, and ...