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Thomas Johannes Emil Schwarz
Marquette University
Computer Science & IT Energy Engineering Industrial & Manufacturing Engineering

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RAID Level 6 and Level 6+ Reliability Thomas Johannes Emil Schwarz
International Journal of Applied Sciences and Smart Technologies Volume 02, Issue 02, December 2020
Publisher : Universitas Sanata Dharma

Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.24071/ijasst.v2i2.2811

Abstract

Storage systems are built of fallible components but have to provide high degrees of reliability. Besides mirroring and triplicating data, redundant storage of information using erasure-correcting codes is the only possibility to have data survive device failure.We provide here exact formula for the data-loss probability of a disk array composed of several RAID Level 6 stripes. This two-failure tolerant is not only used in practice but can also provide a reference point for the assessment of other data organizations.
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