Atom Indonesia Journal
Vol 47, No 2 (2021): August 2021

An Automated Measurement of Image Slice Thickness of Computed Tomography

S. Sofiyatun (Department of Physics, Faculty of Sciences and Mathematics, Diponegoro University, Jl. Prof. Soedarto SH, Tembalang, Semarang 50275, Indonesia)
C. Anam (Department of Physics, Faculty of Sciences and Mathematics, Diponegoro University, Jl. Prof. Soedarto SH, Tembalang, Semarang 50275, Indonesia)
U. M. Zahro (Department of Physics, Faculty of Sciences and Mathematics, Diponegoro University, Jl. Prof. Soedarto SH, Tembalang, Semarang 50275, Indonesia)
D. A. Rukmana (Radiology Department, Indriati Hospital Solo Baru, Jl. Palem Raya, Dusun III, Sukoharjo 57552, Indonesia)
G. Dougherty (Department of Applied Physics and Medical Imaging, California State University Channel Islands, Camarillo, CA 93012, USA)



Article Info

Publish Date
05 Aug 2021

Abstract

Measurement of the slice thickness in computed tomography (CT) is usually made using a special phantom, such as the AAPM CT performance phantom. Images of the phantom are analyzed manually and subjectively. The purpose of this study is to develop an automated system for measuring the slice thickness of the CT image of the phantom using MATLAB software.The CT AAPM performance phantom was scanned by a 128 multi-slice computed tomography scanner (Revolution Evo, GE Healthcare, Waukesha, WI) at a slice thickness of 5 mm with four different phantom orientations and also scanned by a 6 multi-slice CT scanner (Somatom Emotion 6, Siemens AG, Forchheim, Germany) for two slice thicknesses of 5 and 10 mm. Our automatedmethod produced an accurateslice thickness value less than 0.5 mm different from the nominal slice thicknesses and manual measurements. Similar results were obtained when the phantom was rotated. This system is more objective and effective compared to manual systems.

Copyrights © 2021






Journal Info

Abbrev

aij

Publisher

Subject

Materials Science & Nanotechnology

Description

Exist for publishing the results of research and development in nuclear science and technology Starting for 2010 Atom Indonesia published three times a year in April, August, and December The scope of this journal covers experimental and analytical research in all areas of nuclear science and ...