Embedded Radiation sensor with OBIST structure for applications in mixed signal systems

Pablo Petrashin (Universidad Católica de Córdoba)
Walter Lancioni (Universidad Catolica de Cordoba)
Agustín Laprovitta (Universidad Catolica de Cordoba (UCC))
Juan Castagnola (Universidad Catolica de Cordoba (UCC))

JAREE (Journal on Advanced Research in Electrical Engineering)
Vol 5, No 2 (2021): October

Oscillation based testing (OBT) has proven to be a simple and effective test strategy for numerous kind of circuits. In this work, OBT is applied to a radiation sensor to be used as a VLSI cell in embedded applications, implementing an oscillation built-in self-test (OBIST) structure. The oscillation condition is achieved by means of a minimally intrusive switched feedback loop and the response evaluation circuit can be included in a very simple way, minimizing the hardware overhead. The fault simulation indicates a fault coverage of 100% for the circuit under test.Keywords: fault simulation, mixed signal testing, OBIST, oscillation-based test, VLSI testing.