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All Journal JAREE (Journal on Advanced Research in Electrical Engineering)
Agustín Laprovitta
Universidad Catolica de Cordoba (UCC)
Control & Systems Engineering Electrical & Electronics Engineering

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Embedded Radiation sensor with OBIST structure for applications in mixed signal systems Pablo Petrashin; Walter Lancioni; Agustín Laprovitta; Juan Castagnola
JAREE (Journal on Advanced Research in Electrical Engineering) Vol 5, No 2 (2021): October
Publisher : Department of Electrical Engineering ITS and FORTEI

Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.12962/jaree.v5i2.194

Abstract

Oscillation based testing (OBT) has proven to be a simple and effective test strategy for numerous kind of circuits. In this work, OBT is applied to a radiation sensor to be used as a VLSI cell in embedded applications, implementing an oscillation built-in self-test (OBIST) structure. The oscillation condition is achieved by means of a minimally intrusive switched feedback loop and the response evaluation circuit can be included in a very simple way, minimizing the hardware overhead. The fault simulation indicates a fault coverage of 100% for the circuit under test.Keywords: fault simulation, mixed signal testing, OBIST, oscillation-based test, VLSI testing.
Co-Authors Juan Castagnola Pablo Petrashin Walter Lancioni